Mr. Chien, Senior Manager of the Software R&D Department at United Strategy Technology, a publicly listed company, visited the center for Reliability Engineering, MCUT, accompanied by engineers, to discuss R&D issues related to wafer defect inspection. Assistant Professor Le, a member of the Center team, delivered a briefing on the Center’s existing technologies. Although United Strategy Technology proposed stringent inspection specifications required by domestic semiconductor production line process equipment, they expressed strong confidence in the Center’s technologies and looked forward to a promising start to future collaboration.