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2026_01 The Center for Reliability Engineering organized an end-of-term research results sharing meeting and site visit activities.

Our Center for Reliability Engineering and the Department of Electrical Engineering at Chang Gung University have established a long-term collaborative research partnership. To better understand the progress of both parties’ research, the Director of our Center took advantage of the end-of-term period to invite Professor Yong-Hua Chang, from the Department of Electrical Engineering at Chang Gung University (who also serves as Vice Dean of the College of Engineering), to visit our campus. Professor Chang was accompanied by his Ph.D. student, Le Bao Viet, who presented his latest research findings.

Le Bao Viet is currently engaged in research on battery remaining useful life (RUL) prediction, employing a machine learning approach that integrates physics-based model features. This research direction closely aligns with the work conducted by our Center’s postdoctoral researcher, Dr. Jun-Wei Liu, in collaboration with the School of Mechanical Engineering at Hanoi University of Science and Technology, which focuses on fault diagnosis of rotating machinery. As a result, on the day of the presentation, both Le Bao Viet and Dr. Jun-Wei Liu delivered their respective research reports, followed by in-depth discussions and mutual exchanges of ideas.

After the presentations, both parties moved to the campus café for a light meal, where they continued discussions on the details of future collaborative research. During this time, the Director of our Center personally invited Vice Dean Chang to join a visit to Hanoi University of Science and Technology in March 2026. In addition, the Director extended an invitation for Vice Dean Chang to contribute a paper and participate in a conference organized by the Center for Reliability Engineering, scheduled to be held in Kolkata, India, in April 2026.

Finally, the visitors toured several laboratories with other graduate students of the Center, including Professor Yu-Hsien Li’s laboratory, where they learned about the latest wafer defect inspection technologies. They also visited the Intelligent Vehicle R&D Center of our university to observe its achievements in battery module development, power testing, and reliability testing facilities. Vice Dean Chang expressed great admiration for the Center’s strong research momentum and advanced equipment, and expressed his hope that both sides could establish an even closer and more extensive research collaboration in the future.